Invention Grant
- Patent Title: Device and method for roundness measurement
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Application No.: US14859346Application Date: 2015-09-20
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Publication No.: US09651352B2Publication Date: 2017-05-16
- Inventor: Kuang-Chao Fan , Chih-Chin Hsu
- Applicant: 3DFAMILY TECHNOLOGY CO., LTD.
- Applicant Address: TW New Taipei
- Assignee: 3DFAMILY TECHNOLOGY CO., LTD.
- Current Assignee: 3DFAMILY TECHNOLOGY CO., LTD.
- Current Assignee Address: TW New Taipei
- Agent Chieh-Mei Wang
- Priority: TW104120380A 20150624
- Main IPC: G01B5/20
- IPC: G01B5/20

Abstract:
The invention discloses a method for roundness measurement, which includes the steps of, mounting and rotating an object on a rotary table; driving two measuring surfaces of two measurement units to respectively abut against two opposite sides of the object, wherein the two measurement units are disposed on two opposite sides of the rotary table and the two measuring surfaces are parallel to each other and perpendicular to a to surface of the rotary table; during rotation of the rotary table, measuring intermittently a shortest straight line distance between the two measuring surfaces and generating a variation data and after the rotary table completes a full-circle rotation, a processing unit receiving the variation data and generating measured data. The present invention also discloses a device for roundness measurement.
Public/Granted literature
- US20160377406A1 DEVICE AND METHOD FOR ROUNDNESS MEASUREMENT Public/Granted day:2016-12-29
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