Invention Grant
- Patent Title: Method, apparatus and equipment of inspecting quality of LCD
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Application No.: US14354792Application Date: 2013-12-10
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Publication No.: US09652842B2Publication Date: 2017-05-16
- Inventor: Yanyan Yin , Jing Xue , Hongyan Xing , Ziwei Cui , Falong Han
- Applicant: BOE TECHNOLOGY GROUP CO., LTD. , BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Applicant Address: CN Beijing CN Beijing
- Assignee: BOE TECHNOLOGY GROUP CO., LTD.,BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Current Assignee: BOE TECHNOLOGY GROUP CO., LTD.,BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Current Assignee Address: CN Beijing CN Beijing
- Agency: Ladas & Parry LLP
- Priority: CN201310326270 20130730
- International Application: PCT/CN2013/089011 WO 20131210
- International Announcement: WO2015/014067 WO 20150205
- Main IPC: G02F1/13
- IPC: G02F1/13 ; G06T7/00

Abstract:
A method, an apparatus and an equipment of inspecting the quality of an LCD are provided, the method includes: obtaining optical parameters of the LCD; capturing images of the LCD; and determining that the LCD is defective after determining that the optical parameters are not in the range of the preset optical parameters and/or the captured images of the LCD are not consistent with the pre-stored images. Through the technical solution of the present invention, it can effectively differentiate the defect types of a product and record the defect position of the product, thereby it can effectively reduce misjudgment or miss test caused by the visual differences between operators to improve the quality and yield of manufactured LCD.
Public/Granted literature
- US20150036913A1 METHOD, APPARATUS AND EQUIPMENT OF INSPECTING QUALITY OF LCD Public/Granted day:2015-02-05
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