Invention Grant
- Patent Title: Left atrial pressure measurement method and left atrial pressure measurement device
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Application No.: US14174329Application Date: 2014-02-06
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Publication No.: US09655529B2Publication Date: 2017-05-23
- Inventor: Mikio Aoki , Kazunori Uemura , Masaru Sugimachi
- Applicant: SEIKO EPSON CORPORATION , NATIONAL CEREBRAL AND CARDIOVASCULAR CENTER
- Applicant Address: JP Tokyo JP Suita
- Assignee: SEIKO EPSON CORPORATION,NATIONAL CEREBRAL AND CARDIOVASCULAR CENTER
- Current Assignee: SEIKO EPSON CORPORATION,NATIONAL CEREBRAL AND CARDIOVASCULAR CENTER
- Current Assignee Address: JP Tokyo JP Suita
- Agency: Oliff PLC
- Priority: JP2013-024296 20130212
- Main IPC: A61B8/00
- IPC: A61B8/00 ; A61B5/021 ; A61B8/04 ; A61B8/08
Abstract:
A left atrial pressure measurement device includes: a measurement section that measures a first index value that indicates performance of a right ventricle, and a second index value that indicates performance of a left ventricle; and a calculation section that calculates a left atrial pressure using the first index value, the second index value, and a measured right atrial pressure.
Public/Granted literature
- US20140228683A1 LEFT ATRIAL PRESSURE MEASUREMENT METHOD AND LEFT ATRIAL PRESSURE MEASUREMENT DEVICE Public/Granted day:2014-08-14
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