Invention Grant
- Patent Title: Test and measurement device including grooves for receiving probes in a use position
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Application No.: US14151384Application Date: 2014-01-09
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Publication No.: US09664708B2Publication Date: 2017-05-30
- Inventor: Justin D. Dorman , Jason R. Crowe , Evans H. Nguyen , Dwight Hyland
- Applicant: Milwaukee Electric Tool Corporation
- Applicant Address: US WI Brookfield
- Assignee: MILWAUKEE ELECTRIC TOOL CORPORATION
- Current Assignee: MILWAUKEE ELECTRIC TOOL CORPORATION
- Current Assignee Address: US WI Brookfield
- Agency: Michael Best & Friedrich LLP
- Main IPC: G01R1/04
- IPC: G01R1/04 ; G01R1/067

Abstract:
A test and measurement device including a housing, a circuit disposed within the housing, and a display located on the housing. The device includes a first probe and a second probe. Each of the first probe and the second probe includes a probe body, a conductive tip, and a probe wire. Each of the first probe and the second probe is coupled to the housing and in electrical communication with the circuit. The device also includes a first groove that has a first projection and a second projection. The first groove is configured to receive one of the probe bodies, and the projections are configured to retain the one of the probe bodies within the first groove. A second groove is configured to receive the other of the probe bodies.
Public/Granted literature
- US20150192606A1 TEST AND MEASUREMENT DEVICE Public/Granted day:2015-07-09
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