Apparatus and methods to measure capacitance changes for a touch-sensitive capacitive matrix are described. Charge-removal circuits and measurement techniques may be employed to cancel deleterious effects of parasitic capacitances in the touch-sensitive capacitive matrix. Capacitively switching a supply during timed charge removal may be used to cancel unwanted effects due to clock jitter. The apparatus and methods can improve signal-to-noise characteristics, sensitivity, and/or dynamic range for capacitive measurements relating to touch-sensitive capacitive devices.