Invention Grant
- Patent Title: Transistor with improved avalanche breakdown behavior
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Application No.: US15182120Application Date: 2016-06-14
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Publication No.: US09673320B2Publication Date: 2017-06-06
- Inventor: Andreas Meiser , Till Schloesser
- Applicant: Infineon Technologies AG
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Agency: Murphy, Bilak & Homiller, PLLC
- Priority: DE102015109538 20150615
- Main IPC: H01L29/78
- IPC: H01L29/78 ; H01L29/06 ; H01L29/10 ; H01L29/40 ; H01L29/66

Abstract:
A transistor cell includes a drift region, a source region, a body region, and a drain region that is laterally spaced apart from the source region. A gate electrode is adjacent the body region. A field electrode is arranged in the drift region. A source electrode is connected to the source region and the body region, and a drain electrode is connected to the drain region. An avalanche bypass structure is coupled between the source electrode and the drain electrode and includes a first semiconductor layer of the first doping type, a second semiconductor layer of the first doping type, and a pn-junction arranged between the first semiconductor layer and the source electrode. The second semiconductor layer has a higher doping concentration than the first semiconductor layer and is arranged between the second semiconductor layer and the drift region. The drain electrode is electrically connected to the second semiconductor layer.
Public/Granted literature
- US20160365443A1 Transistor with Improved Avalanche Breakdown Behavior Public/Granted day:2016-12-15
Information query
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