- Patent Title: Phase measurement device and method in microwave tomography system
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Application No.: US14496447Application Date: 2014-09-25
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Publication No.: US09678124B2Publication Date: 2017-06-13
- Inventor: Hyuk-Je Kim , Jong-Moon Lee , Seong-Ho Son , Soon-Ik Jeon , Hyung-Do Choi
- Applicant: Electronics and Telecommunications Research Institute
- Applicant Address: KR Daejeon
- Assignee: Electronics and Telecommunications Research Institute
- Current Assignee: Electronics and Telecommunications Research Institute
- Current Assignee Address: KR Daejeon
- Agency: William Park & Associates Ltd.
- Priority: KR10-2013-0114590 20130926
- Main IPC: G01R25/00
- IPC: G01R25/00 ; G01N22/00

Abstract:
A phase measurement method in a microwave tomography system may include transmitting a first Tx frequency signal, receiving a signal corresponding to the first Tx frequency signal, and measuring a first phase value; transmitting a second Tx frequency signal separated by a predetermined discrete frequency from the first Tx frequency signal, receiving a signal corresponding to the second Tx frequency signal, and measuring a second phase value; calculating a first phase difference based on a difference between the first and second phase values; calculating a second phase difference based on the discrete frequency; and determining an unwrapped phase value through comparison between the first and second phase differences.
Public/Granted literature
- US20150084644A1 PHASE MEASUREMENT DEVICE AND METHOD IN MICROWAVE TOMOGRAPHY SYSTEM Public/Granted day:2015-03-26
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