Invention Grant
- Patent Title: Liveness testing methods and apparatuses and image processing methods and apparatuses
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Application No.: US14612632Application Date: 2015-02-03
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Publication No.: US09679212B2Publication Date: 2017-06-13
- Inventor: Wonjun Kim , Sungjoo Suh , Jaejoon Han , Wonjun Hwang
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Gyeonggi-Do
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Gyeonggi-Do
- Agency: Harness, Dickey & Pierce
- Priority: KR10-2014-0055687 20140509; KR10-2014-0077333 20140624
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06T7/00
Abstract:
A liveness testing apparatus includes a testing circuit. The testing circuit is configured to test a liveness of an object included in a received input image based on whether an image of the object has a characteristic indicative of a flat surface or a characteristic indicative of a three-dimensional (3D) structure.
Public/Granted literature
- US20150324629A1 LIVENESS TESTING METHODS AND APPARATUSES AND IMAGE PROCESSING METHODS AND APPARATUSES Public/Granted day:2015-11-12
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