Invention Grant
- Patent Title: Semiconductor constructions
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Application No.: US14321466Application Date: 2014-07-01
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Publication No.: US09679852B2Publication Date: 2017-06-13
- Inventor: Ashim Dutta , Mohd Kamran Akhtar , Shane J. Trapp
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Wells St. John P.S.
- Main IPC: H01L23/482
- IPC: H01L23/482 ; H01L23/532 ; H01L23/522 ; H01L21/768

Abstract:
Some embodiments include a construction having conductive structures spaced from one another by intervening regions. Insulative structures are within the intervening regions. The insulative structures include dielectric spacers and air gaps between the dielectric spacers. Dielectric capping material is over the air gaps. The dielectric capping material is between the dielectric spacers and not over upper surfaces of the dielectric spacers. Some embodiments include a construction having a first conductive structure with an upper surface, and having a plurality of second conductive structures electrically coupled with the upper surface of the first conductive structure and spaced from one another by intervening regions. Air gap/spacer insulative structures are within the intervening regions. The air gap/spacer insulative structures have dielectric spacers along sidewalls of the second conductive structures and air gaps between the dielectric spacers. Dielectric capping material is over the air gaps.
Public/Granted literature
- US20160005693A1 Semiconductor Constructions Public/Granted day:2016-01-07
Information query
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