Invention Grant
- Patent Title: Low-stress dual underfill packaging
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Application No.: US14925159Application Date: 2015-10-28
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Publication No.: US09698072B2Publication Date: 2017-07-04
- Inventor: Peter J. Brofman , Marie-Claude Paquet , Julien Sylvestre
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Steven J. Meyers; Howard M. Cohn; Daniel M. Cohn
- Main IPC: H01L25/00
- IPC: H01L25/00 ; H01L25/065 ; H01L23/00 ; H01L23/31 ; H01L21/56 ; H01L23/498

Abstract:
The present invention relates generally to flip chip technology and more particularly, to a method and structure for reducing internal packaging stresses, improving adhesion properties, and reducing thermal resistance in flip chip packages by using more than one underfill material deposited in different regions of the flip chip interface. According to one embodiment, a method of forming a first underfill in an interior region of an interface such that a periphery region of the interface remains open, and forming a second underfill in the periphery region is disclosed.
Public/Granted literature
- US20160049345A1 LOW-STRESS DUAL UNDERFILL PACKAGING Public/Granted day:2016-02-18
Information query
IPC分类: