- 专利标题: Semiconductor device
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申请号: US15062268申请日: 2016-03-07
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公开(公告)号: US09698280B2公开(公告)日: 2017-07-04
- 发明人: Shinya Sasagawa , Motomu Kurata , Kazuya Hanaoka , Yoshiyuki Kobayashi , Daisuke Matsubayashi
- 申请人: Semiconductor Energy Laboratory Co., Ltd.
- 申请人地址: JP Atsugi-shi, Kanagawa-ken
- 专利权人: Semiconductor Energy Laboratory Co., Ltd.
- 当前专利权人: Semiconductor Energy Laboratory Co., Ltd.
- 当前专利权人地址: JP Atsugi-shi, Kanagawa-ken
- 代理机构: Fish & Richardson P.C.
- 优先权: JP2013-261600 20131218
- 主分类号: H01L29/78
- IPC分类号: H01L29/78 ; H01L29/786 ; H01L29/04 ; H01L29/24
摘要:
A semiconductor device with favorable electrical characteristics is provided. The semiconductor device includes an insulating layer, a semiconductor layer over the insulating layer, a source electrode layer and a drain electrode layer electrically connected to the semiconductor layer, a gate insulating film over the semiconductor layer, the source electrode layer, and the drain electrode layer, and a gate electrode layer overlapping with part of the semiconductor layer, part of the source electrode layer, and part of the drain electrode layer with the gate insulating film therebetween. A cross section of the semiconductor layer in the channel width direction is substantially triangular or substantially trapezoidal. The effective channel width is shorter than that for a rectangular cross section.
公开/授权文献
- US09842940B2 Semiconductor device 公开/授权日:2017-12-12
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