Invention Grant
- Patent Title: Capacitance measurement device and electronic device thereof
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Application No.: US14474296Application Date: 2014-09-01
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Publication No.: US09702914B2Publication Date: 2017-07-11
- Inventor: He-Wei Huang , Chun-Hung Chen , Chih-Yuan Chang
- Applicant: NOVATEK Microelectronics Corp.
- Applicant Address: TW Hsin-Chu
- Assignee: NOVATEK Microelectronics Corp.
- Current Assignee: NOVATEK Microelectronics Corp.
- Current Assignee Address: TW Hsin-Chu
- Agent Winston Hsu
- Priority: TW99114655A 20100507
- Main IPC: G01R27/26
- IPC: G01R27/26 ; G06F3/044 ; H03K17/96

Abstract:
A capacitance measurement device for measuring the capacitance of a measured capacitor includes a charging control unit for charging the measured capacitor; a discharging control unit for discharging the measured capacitor; a voltage converting circuit coupled to the measured capacitor, for converting a voltage signal on the measured capacitor into a value that represents the capacitance of the measured capacitor; wherein in a first period, one of the charging control unit and the discharge control unit charges/discharges the measured capacitor and in a second period after the first period, the other one of the charging control unit and the discharge control unit discharges/charges the measured capacitor.
Public/Granted literature
- US20140368223A1 CAPACITANCE MEASUREMENT DEVICE AND ELECTRONIC DEVICE THEREOF Public/Granted day:2014-12-18
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