Invention Grant
- Patent Title: Automatic analyzer
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Application No.: US14890253Application Date: 2014-05-19
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Publication No.: US09709588B2Publication Date: 2017-07-18
- Inventor: Akihisa Makino , Mitsuhiro Hishinuma , Toshiyuki Shimamori , Masato Ishizawa
- Applicant: Hitachi High-Technologies Corporation
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JP2013-126248 20130617
- International Application: PCT/JP2014/063144 WO 20140519
- International Announcement: WO2014/203663 WO 20141224
- Main IPC: G01N35/04
- IPC: G01N35/04 ; G01N35/10 ; G01N35/02 ; G01N35/00

Abstract:
An automatic analyzer with high processing capacity is capable of immediately measuring an emergency specimen rack. The automatic analyzer includes a conveying line for conveying a specimen rack, and an analysis unit which has a dispensing line in which a plurality of specimen racks are arranged for waiting until sample dispensing, and a sampling area for dispensing the sample to the analysis unit. A rack save area is provided in the dispensing line and at a position adjacent to the upstream side of the sampling area. When a specimen rack exists in the sampling area at the time of measuring an emergency specimen rack, a controller moves the specimen rack to the save area and positions the emergency specimen rack to be moved from a downstream side of the sampling area to the sampling area.
Public/Granted literature
- US20160124010A1 AUTOMATIC ANALYZER Public/Granted day:2016-05-05
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