Invention Grant
- Patent Title: Crop quality sensor based on specular reflectance
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Application No.: US14853978Application Date: 2015-09-14
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Publication No.: US09723784B2Publication Date: 2017-08-08
- Inventor: Marshall T. Bremer , Nicholas L. Butts
- Applicant: Appareo Systems, LLC
- Applicant Address: US ND Fargo
- Assignee: Appareo Systems, LLC
- Current Assignee: Appareo Systems, LLC
- Current Assignee Address: US ND Fargo
- Agency: Law Office of Mark Brown, LLC
- Agent Mark E. Brown
- Main IPC: G06K9/00
- IPC: G06K9/00 ; A01D41/127 ; G01G19/08 ; A01D57/12 ; G01B7/14 ; G01N33/00 ; G01S13/86 ; G01S13/87 ; G01S17/02 ; G01S17/88 ; H04N5/225 ; G06T7/00 ; B65G43/08 ; G01L1/00 ; G01S17/89 ; G01S7/41 ; G01S13/88 ; G06T7/11 ; G06T7/136 ; H04N5/232

Abstract:
A crop quality sensor, comprising an illumination source, an imaging device, and a processor executing application software. The illumination source is shone onto a crop sample, and an image is taken with the imaging device of the illuminated crop sample. The software executing on the processor is used to analyze the image to identify the outlines of individual kernels and to identify which of those outlines contain a specular highlight, indicative that the kernel is whole and unbroken, while the absence of such a specular highlight is indicative of a broken kernel.
Public/Granted literature
- US20160078304A1 CROP QUALITY SENSOR BASED ON SPECULAR REFLECTANCE Public/Granted day:2016-03-17
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