Invention Grant
- Patent Title: Combining monitoring sensor measurements and system signals to determine device context
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Application No.: US14090966Application Date: 2013-11-26
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Publication No.: US09726498B2Publication Date: 2017-08-08
- Inventor: Deborah Meduna , Dev Rajnarayan , James V. Steele , Ian Chen
- Applicant: Sensor Platforms, Inc.
- Applicant Address: US CA San Jose
- Assignee: Sensor Platforms, Inc.
- Current Assignee: Sensor Platforms, Inc.
- Current Assignee Address: US CA San Jose
- Agency: Foley & Lardner LLP
- Main IPC: G01C21/16
- IPC: G01C21/16 ; G06F1/32 ; G01C21/34
Abstract:
A processing apparatus including one or more processors and memory obtains one or more sensor measurements generated by one or more monitoring sensors of one or more devices, including one or more monitoring sensor measurements from a respective monitoring sensor of a respective device and obtains one or more system signals including a respective system signal corresponding to current operation of the respective device. The processing apparatus determines device context information for the respective device based on the one or more sensor measurements and the one or more system signals and adjusts operation of the device in accordance with the device context information.
Public/Granted literature
- US20140149060A1 Combining Monitoring Sensor Measurements and System Signals to Determine Device Context Public/Granted day:2014-05-29
Information query
IPC分类:
