Invention Grant
- Patent Title: Measurement apparatus
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Application No.: US15234339Application Date: 2016-08-11
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Publication No.: US09726595B2Publication Date: 2017-08-08
- Inventor: Kimiko Kazumura , Hiroshi Tsuchiya
- Applicant: HAMAMATSU PHOTONICS K.K.
- Applicant Address: JP Hamamatsu-shi, Shizuoka
- Assignee: HAMAMATSU PHOTONICS K.K.
- Current Assignee: HAMAMATSU PHOTONICS K.K.
- Current Assignee Address: JP Hamamatsu-shi, Shizuoka
- Agency: Drinker Biddle & Reath LLP
- Priority: JP2015-160319 20150817
- Main IPC: G01N21/64
- IPC: G01N21/64 ; G01N21/01 ; G01N21/76 ; G01N33/49

Abstract:
A measurement apparatus includes a sample stage, an excitation unit, a light receiving unit, a stimulant applying nozzle, and a spray nozzle in a measurement space inside a body case, and also includes a heating unit and a gas supplying unit. The body case includes an inner case surrounding the measurement space, and an outer case surrounding the inner case to shield the measurement space from light from the outside and seal the measurement space. The heating unit is disposed between the inner case and the outer case and adjusts temperature in the measurement space through the inner case. The gas supplying unit supplies gas having controlled temperature and humidity into the measurement space and adjusts temperature and humidity in the measurement space.
Public/Granted literature
- US20170052109A1 MEASUREMENT APPARATUS Public/Granted day:2017-02-23
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