Invention Grant
- Patent Title: Non-destructive inspection device
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Application No.: US15033440Application Date: 2014-10-30
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Publication No.: US09726622B2Publication Date: 2017-08-08
- Inventor: Atsushi Momose
- Applicant: Tohoku University
- Applicant Address: JP Sendai-shi, Miyagi
- Assignee: Tohoku University
- Current Assignee: Tohoku University
- Current Assignee Address: JP Sendai-shi, Miyagi
- Agency: Seep IP Law Group LLP
- Priority: JP2013-226437 20131031; JP2014-085843 20140417
- International Application: PCT/JP2014/078994 WO 20141030
- International Announcement: WO2015/064723 WO 20150507
- Main IPC: G01N23/201
- IPC: G01N23/201 ; G01N23/20 ; A61B6/00 ; G21K1/06

Abstract:
An accurate non-destructive inspection of a moving subject is conducted using a radiation source unit that irradiates radioactive rays toward gratings. Each grating includes a plurality of grating members. A radioactive ray detector unit detects the radioactive rays diffracted by the plurality of grating members. The plurality of grating members are arranged with a predetermined phase difference such that moiré pattern images respectively formed by the radioactive rays transmitted through first to third partial areas have a phase difference between the moiré pattern images.
Public/Granted literature
- US20160252470A1 NON-DESTRUCTIVE INSPECTION DEVICE Public/Granted day:2016-09-01
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