Invention Grant
- Patent Title: Single particle analyzer and single particle analysis method
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Application No.: US14484305Application Date: 2014-09-12
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Publication No.: US09726636B2Publication Date: 2017-08-08
- Inventor: Sadato Hongo , Tomoji Kawai , Makusu Tsutsui , Masateru Taniguchi , Soh Ryuzaki
- Applicant: KABUSHIKI KAISHA TOSHIBA , OSAKA UNIVERSITY
- Applicant Address: JP Minato-ku JP Suita-shi
- Assignee: KABUSHIKI KAISHA TOSHIBA,OSAKA UNIVERSITY
- Current Assignee: KABUSHIKI KAISHA TOSHIBA,OSAKA UNIVERSITY
- Current Assignee Address: JP Minato-ku JP Suita-shi
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Main IPC: G01N27/447
- IPC: G01N27/447 ; G01N15/12 ; G01N33/487 ; G01N15/10

Abstract:
According to one embodiment, provided is a single particle analyzing device including a measuring vessel, first and second chambers in the vessel defined by an insulating membrane, a pore opening in the membrane to connect the chambers, and first and second electrodes in the chambers. Electric current flows between the electrodes through the pore. Electrical characteristics are measured during migration of the target from the first chamber to the second chamber to measure the size and shape of the target. (a) t
Public/Granted literature
- US20140374255A1 SINGLE PARTICLE ANALYZER AND SINGLE PARTICLE ANALYSIS METHOD Public/Granted day:2014-12-25
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