Invention Grant
- Patent Title: Wafer level micro-electro-mechanical systems package with accelerometer and gyroscope
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Application No.: US14067727Application Date: 2013-10-30
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Publication No.: US09726689B1Publication Date: 2017-08-08
- Inventor: Hemant Desai , Peter Harper , Demetre Kondylis
- Applicant: Maxim Integrated Products, Inc.
- Applicant Address: US OH Solon
- Assignee: Hanking Electronics Ltd.
- Current Assignee: Hanking Electronics Ltd.
- Current Assignee Address: US OH Solon
- Agency: Hartman Global IP Law
- Agent Gary M. Hartman; Domenica N. S. Hartman
- Main IPC: G01P1/02
- IPC: G01P1/02 ; H01L29/84 ; G01P15/08 ; B81C1/00

Abstract:
The invention relates to sensors, and more particularly, a sensor device having accelerometer and gyroscope integrated into a low cost compact package. The device includes: MEMs wafer; and an ASIC wafer bonded to the MEMs wafer; a wafer-level-package redistribution layer (WLP RDL) formed on a surface of the ASIC wafer; and a ball grid array having a plurality of solder balls that electrically connect the package to a circuit board. The MEMs wafer includes the accelerometer and gyroscope, while the ASIC wafer includes two separate cavities corresponding to the accelerometer and gyroscope, respectively. The ASIC wafer includes electrical circuits/components to process the readout signals received from the accelerometer and gyroscope.
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