Invention Grant
- Patent Title: Impedance measurement device and method
-
Application No.: US13626434Application Date: 2012-09-25
-
Publication No.: US09726702B2Publication Date: 2017-08-08
- Inventor: Dermot O'Keeffe , Donal Bourke , David Harty , Tudor Vinereanu , Colin Lyden
- Applicant: Analog Devices, Inc.
- Applicant Address: US MA Norwood
- Assignee: Analog Devices, Inc.
- Current Assignee: Analog Devices, Inc.
- Current Assignee Address: US MA Norwood
- Agency: Schwegman Lundberg & Woessner, P.A.
- Main IPC: G01R31/28
- IPC: G01R31/28 ; H03F1/26 ; H03B19/00 ; G01R27/28

Abstract:
A digital sine wave may be converted to an analog signal at a digital to analog converter (DAC). The converted analog signal may be supplied to a device and an analog return signal from the device may be passed through a relaxed anti-aliasing filter and converted to digital code words at an analog to digital converter (ADC). An impedance may be calculated from the results of a Fourier analysis of the digital code words. The ADC and DAC clock frequencies may be asynchronous, independently variable, and have a greatest common factor of 1. The clock frequencies of the ADC and/or DAC may be adjusted to change a location of images in the ADC spectrum. By using these different, adjustable clock frequencies for the ADC and the DAC, an analog signal may have increased aliasing without introducing signal errors at a frequency of interest.
Public/Granted literature
- US20130271155A1 IMPEDANCE MEASUREMENT DEVICE AND METHOD Public/Granted day:2013-10-17
Information query