Invention Grant
- Patent Title: Device for measuring the state of polarization of an incident wave of frequency 10 GHz to 30 THz
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Application No.: US14365395Application Date: 2012-12-04
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Publication No.: US09726703B2Publication Date: 2017-08-08
- Inventor: Wojciech Knap , Frédéric Teppe , Nina Diakonova , Michel Diakonov , Oleg Klimenko , Sergey Ganichev , Christop Drexler
- Applicant: CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE (CNRS)
- Applicant Address: FR Paris
- Assignee: Centre National De La Recherche Scientifique (CNRS)
- Current Assignee: Centre National De La Recherche Scientifique (CNRS)
- Current Assignee Address: FR Paris
- Agency: Banner & Witcoff, Ltd.
- Priority: FR1161615 20111214
- International Application: PCT/EP2012/074375 WO 20121204
- International Announcement: WO2013/087456 WO 20130620
- Main IPC: G01J3/42
- IPC: G01J3/42 ; G01R29/08 ; G01J4/00

Abstract:
The invention relates to a device (1) for measuring the state of polarization of an incident wave of frequency 10 GHz to 30 THz, comprising a field effect transistor (2), a reception antenna (3). According to the invention, the antenna parts (31, 33) detect a component of polarization of the wave, collinear with a direction (X) causing in the transistor (2) an alternating detection voltage (Us), the parts (32, 33) detect a component of polarization of the wave, collinear with a direction (Y) causing the appearance in the transistor (2) of an alternating detection voltage (Ud), the transistor (2) being designed to generate, as electrical detection signal (ΔU) between the source terminal (21) and the drain terminal (22), a DC detection voltage (ΔU) a part of which is determined by the state of elliptical polarization of the wave by interference in the transistor (2) between the alternating voltages (Us, Ud).
Public/Granted literature
- US20140375512A1 DEVICE FOR MEASURING THE STATE OF POLARIZATION OF AN INCIDENT WAVE OF FREQUENCY 10 GHZ TO 30 THZ Public/Granted day:2014-12-25
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