Invention Grant
- Patent Title: Testing system with differing testing slots
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Application No.: US14577116Application Date: 2014-12-19
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Publication No.: US09726717B2Publication Date: 2017-08-08
- Inventor: Christopher Eugene Maulsby , Allen Daryl Webb
- Applicant: Seagate Technology LLC
- Applicant Address: US CA Cupertino
- Assignee: Seagate Technology LLC
- Current Assignee: Seagate Technology LLC
- Current Assignee Address: US CA Cupertino
- Agency: Hall Estill Attorneys at Law
- Main IPC: G01R31/00
- IPC: G01R31/00 ; G01R31/28
Abstract:
A testing environment may have at least one controller connected to at least first and second testing slots positioned in a housing. The first testing slot can be configured with a first thermal range capability and the second testing slot may be configured with a second thermal range capability that differs from the first thermal range capability.
Public/Granted literature
- US20160003894A1 TESTING SYSTEM WITH DIFFERING TESTING SLOTS Public/Granted day:2016-01-07
Information query
