Invention Grant
- Patent Title: Oscillation-based systems and methods for testing RFID straps
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Application No.: US14584612Application Date: 2014-12-29
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Publication No.: US09726721B2Publication Date: 2017-08-08
- Inventor: Adrian N. Farr , Ian James Forster
- Applicant: Avery Dennison Retail Information Services, LLC
- Applicant Address: US MA Westborough
- Assignee: AVERY DENNISON RETAIL INFORMATION SERVICES, LLC
- Current Assignee: AVERY DENNISON RETAIL INFORMATION SERVICES, LLC
- Current Assignee Address: US MA Westborough
- Agency: Avery Dennison Retail Information Services, LLC
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01R27/26 ; G01R23/02

Abstract:
Systems and methods are provided for testing remote frequency identification (RFID) straps. A testing system includes an amplifier electrically coupled to an inductor or inductive component. The system further includes a pair of contact points to be placed in contact with a pair of contact pads of an RFID strap. Connecting the contact points and the contact pads places the RFID strap in parallel with the inductor to define a resonant circuit. The characteristics of the resonant circuit as an oscillator depend at least in part on the capacitance and the resistance of the RFID strap. As such, the characteristics of the resonant circuit as an oscillator may be monitored to determine the capacitance and/or the resistance of the RFID strap. One or more characteristics of the RFID strap may be compared to one or more threshold values to determine whether the RFID strap is acceptable or defective.
Public/Granted literature
- US20160003899A1 OSCILLATION-BASED SYSTEMS AND METHODS FOR TESTING RFID STRAPS Public/Granted day:2016-01-07
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