Invention Grant
- Patent Title: Power circuit abnormality detection method
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Application No.: US14445405Application Date: 2014-07-29
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Publication No.: US09726725B2Publication Date: 2017-08-08
- Inventor: Mayuko Wakida , Yuta Iwai , Hiroshi Sumasu , Kohji Kimura
- Applicant: JTEKT CORPORATION
- Applicant Address: JP Osaka-shi
- Assignee: JTEKT CORPORATION
- Current Assignee: JTEKT CORPORATION
- Current Assignee Address: JP Osaka-shi
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2013-161376 20130802; JP2013-161377 20130802
- Main IPC: G01R31/327
- IPC: G01R31/327 ; H01H47/00 ; B60L3/00 ; B60L11/00 ; H02M1/36 ; H02J7/34 ; H02J7/14

Abstract:
A power circuit abnormality detection method for a power circuit detects whether an abnormality in a power source relay exists. The power circuit includes a pre-charge circuit opening and closing a connection between a direct current power source and a smoothing condenser by bypassing the power source relay to pre-charge the smoothing condenser, and a discharge circuit connected in parallel to the smoothing condenser to discharge electric charges stored in the smoothing condenser via a discharge resistance when a discharge switch is closed. The power circuit abnormality detection method includes a step of detecting whether the open contact abnormality in the power source relay exists based on whether a charge voltage of the smoothing condenser is reduced when a predetermined period of time has elapsed since both the discharge circuit and the power source relay are closed after the pre-charge circuit is opened.
Public/Granted literature
- US20150035539A1 POWER CIRCUIT ABNORMALITY DETECTION METHOD Public/Granted day:2015-02-05
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