Invention Grant
- Patent Title: Machine vision inspection system and method for obtaining an image with an extended depth of field
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Application No.: US14092862Application Date: 2013-11-27
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Publication No.: US09726876B2Publication Date: 2017-08-08
- Inventor: Robert Kamil Bryll
- Applicant: Mitutoyo Corporation
- Applicant Address: JP Kawasaki-shi, Kanagawa-ken
- Assignee: Mitutoyo Corporation
- Current Assignee: Mitutoyo Corporation
- Current Assignee Address: JP Kawasaki-shi, Kanagawa-ken
- Agency: Christensen O'Connor Johnson Kindness PLLC
- Main IPC: G02B21/00
- IPC: G02B21/00 ; G02B21/36 ; G02B27/00 ; G02B21/24

Abstract:
A method for operating an imaging system of a machine vision inspection system to provide an extended depth of field (EDOF) image. The method comprises (a) placing a workpiece in a field of view; (b) periodically modulating a focus position of the imaging system without macroscopically adjusting the spacing between elements in the imaging system, the focus position is periodically modulated over a plurality of positions along a focus axis direction in a focus range including a workpiece surface height; (c) exposing a first preliminary image during an image integration time while modulating the focus position in the focus range; and (d) processing the first preliminary image to remove blurred image contributions occurring in the focus range during the image integration time to provide an EDOF image that is focused throughout a larger depth of field than the imaging system provides at a single focal position.
Public/Granted literature
- US20150145980A1 Machine Vision Inspection System and Method for Obtaining an Image With an Extended Depth of Field Public/Granted day:2015-05-28
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