Invention Grant
- Patent Title: Parallelization method and electronic device based on profiling information
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Application No.: US14789062Application Date: 2015-07-01
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Publication No.: US09727382B2Publication Date: 2017-08-08
- Inventor: Jaehan Koh , Anuradha Oberoi , GopalaKrishna Puligedda Sharma , Raghavan Velappan , Priyank Popatlal Faldu
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Cha & Reiter, LLC
- Priority: KR10-2014-0082039 20140701
- Main IPC: G06F9/46
- IPC: G06F9/46 ; G06F9/44 ; G06F9/50 ; G06F9/48

Abstract:
A parallelization method includes: obtaining profiling information for each job step of a job by performing profiling of the job to be executed on an electronic device; determining at least one job step to be parallelized on a central processing unit (CPU) and at least one heterogeneous unit of the electronic device among a plurality of job steps of the job based on the profiling information; determining a unit to process each unit data among the CPU and the heterogeneous unit based on the profiling information, with respect to the determined at least one job step; and determining a unit to process each task among the CPU and the heterogeneous unit based on the profiling information, with respect to at least one job step including a plurality of separately executable tasks in the determined at least one job step.
Public/Granted literature
- US20160004570A1 PARALLELIZATION METHOD AND ELECTRONIC DEVICE Public/Granted day:2016-01-07
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