Invention Grant
- Patent Title: Image evaluation device, image evaluation method and program storage medium
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Application No.: US14034710Application Date: 2013-09-24
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Publication No.: US09727805B2Publication Date: 2017-08-08
- Inventor: Hideki Yamagishi
- Applicant: FUJIFILM Corporation
- Applicant Address: JP Tokyo
- Assignee: FUJIFILM CORPORATION
- Current Assignee: FUJIFILM CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: McGinn IP Law Group, PLLC.
- Priority: JP2012-218748 20120928
- Main IPC: G06K15/00
- IPC: G06K15/00 ; G06K15/02 ; H04N1/00 ; G06T7/00

Abstract:
An image evaluation device includes: a reading unit that reads a sample image included in a sample printout recognized as a non-defective printout and that reads an inspection object image included in an inspection object printout obtained by printing an image corresponding to the sample image on a recording medium using a printing device based on image data representing the image; an extraction unit that extracts a line defect including a linear pattern formed in a specific direction from the inspection object image represented by inspection object image data, based on a difference value between sample image data obtained by reading the sample image and the inspection object image data; and an evaluation unit that evaluates a visibility of the line defect extracted by the extraction unit.
Public/Granted literature
- US20140092419A1 IMAGE EVALUATION DEVICE, IMAGE EVALUATION METHOD AND PROGRAM STORAGE MEDIUM Public/Granted day:2014-04-03
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