Invention Grant
- Patent Title: Memory system that handles access to bad blocks
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Application No.: US15062012Application Date: 2016-03-04
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Publication No.: US09728275B2Publication Date: 2017-08-08
- Inventor: Nobuhiro Tsuji , Kenichirou Kada , Shinya Takeda , Toshihiko Kitazume , Shunsuke Kodera , Tetsuya Iwata , Yoshio Furuyama , Hirosuke Narai
- Applicant: KABUSHIKI KAISHA TOSHIBA
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Patterson & Sheridan, LLP
- Priority: JP2015-167324 20150827
- Main IPC: G11C29/38
- IPC: G11C29/38 ; G06F3/06 ; G11C29/44

Abstract:
A memory system includes a plurality of pins for connection to the outside of the memory system, one of the pins being configured to receive a command signal, a memory cell array including a plurality of first memory blocks and a second memory block in which status data indicating which of the first memory blocks is defective, is stored, and a control circuit configured to determine whether or not a first memory block targeted by the command signal is indicated as being defective in the status data. The control circuit allows an operation to be performed on the targeted first memory block in accordance with the command signal when the targeted first memory block is not indicated as being defective, and blocks the operation to be performed on the targeted first memory block when the targeted first memory block is indicated as being defective.
Public/Granted literature
- US20170062076A1 MEMORY SYSTEM THAT HANDLES ACCESS TO BAD BLOCKS Public/Granted day:2017-03-02
Information query