Invention Grant
- Patent Title: Strip testing of semiconductor devices
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Application No.: US15162871Application Date: 2016-05-24
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Publication No.: US09728492B1Publication Date: 2017-08-08
- Inventor: Thiong Zhou See , Wee Boon Tay , Lay Yeap Lim
- Applicant: Infineon Technologies AG
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Agency: Dicke, Billig & Czaja, PLLC
- Main IPC: H01L21/66
- IPC: H01L21/66 ; H01L21/78 ; H01L23/495 ; H01L21/56 ; H01L23/00

Abstract:
A strip of semiconductor devices includes a plurality of leadframes electrically isolated from each other, a plurality of semiconductor chips, and an encapsulation material. Each leadframe has a first surface and a second surface opposite to the first surface. At least one semiconductor chip of the plurality of semiconductor chips is electrically coupled to the first surface of each leadframe. The encapsulation material encapsulates each semiconductor chip and at least portions of each leadframe.
Information query
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