Invention Grant
- Patent Title: Semiconductor wafer and semiconductor die
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Application No.: US14109162Application Date: 2013-12-17
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Publication No.: US09728511B2Publication Date: 2017-08-08
- Inventor: Hsi-Jung Wu , Volume Chien , Ying-Lang Wang , Hsin-Chi Chen , Ying-Hao Chen , Hung-Ta Huang
- Applicant: Taiwan Semiconductor Manufacturing CO., LTD.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Main IPC: H01L23/544
- IPC: H01L23/544 ; H01L23/00 ; H01L23/58 ; H01L21/784

Abstract:
A semiconductor wafer includes a substrate, an integrated circuit and a die seal ring structure. The substrate is with a die region, a die seal ring region surrounding the die region and a scribe line region surrounding the die seal ring region. The substrate includes a first surface and a second surface opposite to the first surface, and periodic recesses within the first surface of the die seal ring region, the scribe line region or both the die seal ring region and the scribe line region. The integrated circuit is located on the first surface and the second surface of the die region. The die seal ring structure is located on the second surface of the die seal ring region. A semiconductor die is also provided.
Public/Granted literature
- US20150170985A1 Semiconductor Wafer And Semiconductor Die Public/Granted day:2015-06-18
Information query
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