The present invention is directed to an electrical wiring device that includes an automatic test circuit configured to commence an automatic test at a predetermined time such that a test current propagates on a test conductor. The sensor assembly provides a sensor test output responsive to the test current only if both the differential transformer and the grounded neutral transformer are operative. A fault detector circuit is configured to generate a test detection signal in response to the sensor test output only if the fault detector circuit is operable and the at least one power supply is substantially charged. A device integrity evaluation circuit includes a timer that effects a tripped state when a time measurement exceeds a threshold, the test detection signal resetting the time measurement when properly wired before the time measurement exceeds the predetermined threshold but does not reset the time measurement when miswired.