Device and a method of forming an integrated circuit (IC) that offers protection against ESD in RE applications is disclosed. The device includes a transmission line (TL) coupled to a signal pad. The TL is a short circuited stub that is configured as an ESD protection device and as a band pass filter in dependence of a center frequency of the band pass filter. The TL is configured to pass through a signal in response to a frequency of the signal being within an allowable range of frequencies of the band pass filter. The TL functioning as an ESD protection device is configured to shunt the signal in response to the frequency being outside the allowable range. The IC may include an array of control switches that are operable to change an electrical length L of the TL. The center frequency is tunable by controlling the electrical length L.