Invention Grant
- Patent Title: Image sensor pixel with memory node having buried channel and diode portions
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Application No.: US14665803Application Date: 2015-03-23
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Publication No.: US09729810B2Publication Date: 2017-08-08
- Inventor: Assaf Lahav , Amos Fenigstein , Yakov Roizin , Avi Strum
- Applicant: Tower Semiconductor Ltd.
- Applicant Address: US IL Migdal Haemek
- Assignee: Tower Semiconductor Ltd.
- Current Assignee: Tower Semiconductor Ltd.
- Current Assignee Address: US IL Migdal Haemek
- Agency: Bever, Hoffman & Harms, LLP
- Main IPC: H04N5/335
- IPC: H04N5/335 ; H04N5/3745 ; H04N5/376 ; H01L27/146

Abstract:
A global shutter (GS) image sensor pixel includes a pinned photodiode connected to a memory node by a first transfer gate transistor, and a floating diffusion connected to the memory node by a second transfer gate transistor. The memory node includes a buried channel portion disposed under the first transfer gate transistor and a contiguous pinned diode portion disposed between the first and second transfer gate transistors, where the two memory node portions have different doping levels such that an intrinsic lateral electrical field drives electrons from the buried channel portion into the pinned diode portion. The floating diffusion node similarly includes a buried channel portion disposed under the second transfer gate transistor and a contiguous pinned diode portion that generate a second intrinsic lateral electrical field that drives electrons into the pinned diode portion of the floating diffusion. A 6T CMOS pixel is disclosed that facilitates low-noise CDS readout.
Public/Granted literature
- US20160286151A1 Image Sensor Pixel With Memory Node Having Buried Channel And Diode Portions Public/Granted day:2016-09-29
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