A system for monitoring a component is provided. The system includes an electrical field scanner for analyzing an electrical field across a reference zone, and a processor in operable communication with the electrical field scanner. The reference zone may include a plurality of fiducials configured on the component to influence the electrical field. The processor may be operable for measuring an electrical field value along a mutually-orthogonal X-axis and Y-axis, assembling a zone profile including a data point set according to the measured electrical field value. Methods of using the system are also provided.