Invention Grant
- Patent Title: Phantom for measuring thickness of thin layer using ultrasonic imaging device and method of using thereof
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Application No.: US14522351Application Date: 2014-10-23
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Publication No.: US09737284B2Publication Date: 2017-08-22
- Inventor: Yong Tae Kim , Bong Young Ahn , Il Doh , Wuon-Shick Kim
- Applicant: Korea Research Institute of Standards and Science
- Applicant Address: KR Daejeon
- Assignee: Korea Research Institute of Standards and Science
- Current Assignee: Korea Research Institute of Standards and Science
- Current Assignee Address: KR Daejeon
- Agency: Kaplan Breyer Schwarz, LLP
- Main IPC: A61B8/00
- IPC: A61B8/00 ; G01N29/30
Abstract:
A phantom for measuring thickness of a thin layer and a method of using thereof. The phantom may include a non-scattering muscle mimicking material having a flat top surface; a plurality of soft tissue mimicking thin layers placed in a first area, which is at least a part of a top surface of the non-scattering muscle mimicking material, and having thicknesses different from each other; and an anechoic blood mimicking liquid material placed in an area other than the first area among an entire area of the top surface of the non-scattering muscle mimicking material and on a top surface of the plurality of soft tissue mimicking thin layers.
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