A system for generating a program used to direct the operation of a solder paste inspection machine is provided. The system includes a solder paste inspection system having a stencil mounting bracket located therein and configured to hold a solder paste printing stencil in position within an inspection region of the solder paste inspection system. An image sensor is mounted in the solder paste inspection system and is configured to acquire images of a stencil mounted on the stencil mounting bracket. A controller is coupled to the image sensor and is configured to generate a solder paste inspection program using the acquired images of the stencil.