Invention Grant
- Patent Title: Method and apparatus for measuring channel quality in multiple input multiple output system
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Application No.: US14733414Application Date: 2015-06-08
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Publication No.: US09755709B2Publication Date: 2017-09-05
- Inventor: Dong-Sik Kim , Soo-Bok Yeo
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR
- Assignee: Samsung Electronics Co., Ltd
- Current Assignee: Samsung Electronics Co., Ltd
- Current Assignee Address: KR
- Agency: The Farrell Law Firm, P.C.
- Priority: KR10-2014-0116173 20140902
- Main IPC: H04B7/04
- IPC: H04B7/04 ; H04B7/0413 ; H04L25/02 ; H04B17/336 ; H04B7/06

Abstract:
A method and an apparatus for measuring channel quality in a MIMO system is provided. The method includes measuring a first SINR based on an assumption that a first detector is used, using a channel estimation value of a reception signal with respect to each of a plurality of space layers, and a second SINR for each of the plurality of space layers corresponding to a case where the plurality of space layers exist independently using the channel estimation value of the reception signal; determining a Log Likelihood Ratio of reception data based on an assumption that a second detector is used, with respect to each of the plurality of space layers; and generating channel quality information based on an assumption that the second detector is used, based on the first SINR and the second SINR with respect to each of the plurality of space layers, and the LLR.
Public/Granted literature
- US20160065274A1 METHOD AND APPARATUS FOR MEASURING CHANNEL QUALITY IN MULTIPLE INPUT MULTIPLE OUTPUT SYSTEM Public/Granted day:2016-03-03
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