Invention Grant
- Patent Title: Magnetic inspection systems for inspection of target objects
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Application No.: US14166367Application Date: 2014-01-28
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Publication No.: US09759686B2Publication Date: 2017-09-12
- Inventor: Mandar Diwakar Godbole , Changting Wang , Andrzej Michal May , Nilesh Tralshawala , Waseem Ibrahim Faidi
- Applicant: General Electric Company
- Applicant Address: US NY Niskayuna
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Niskayuna
- Agent Pabitra K. Chakrabarti
- Main IPC: G01N27/82
- IPC: G01N27/82 ; G01R33/12 ; G01N27/90

Abstract:
Inspection systems provided herein include drive coils capable of being excited to generate a substantially uniform magnetic field about an object. The object includes a ferromagnetic adhesive adhered thereto. The inspection systems may also include an array of sensor coils adapted to detect the magnetic field from the drive coils after the magnetic field interacts with the ferromagnetic adhesive and to produce a voltage output corresponding to the detected magnetic field.
Public/Granted literature
- US20140139211A1 MAGNETIC INSPECTION SYSTEMS FOR INSPECTION OF TARGET OBJECTS Public/Granted day:2014-05-22
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