- Patent Title: Semiconductor device and semiconductor device manufacturing method
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Application No.: US14718435Application Date: 2015-05-21
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Publication No.: US09761463B2Publication Date: 2017-09-12
- Inventor: Kazumasa Tanida , Takamitsu Yoshida , Kuniaki Utsumi , Atsuko Kawasaki
- Applicant: Toshiba Memory Corporation
- Applicant Address: JP Minato-ku
- Assignee: TOSHIBA MEMORY CORPORATION
- Current Assignee: TOSHIBA MEMORY CORPORATION
- Current Assignee Address: JP Minato-ku
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2014-140390 20140708
- Main IPC: H01L21/768
- IPC: H01L21/768 ; H01L21/283 ; H01L21/48 ; H01L23/498 ; H01L25/065 ; H01L25/18 ; H01L25/00 ; H01L27/146

Abstract:
According to embodiments, a semiconductor device is provided. The semiconductor device includes an insulation layer, an electrode, and a groove. The insulation layer is provided on a surface of a substrate. The electrode is buried in the insulation layer, and a first end surface of the electrode is exposed from the insulation layer. The groove is formed around the electrode on the surface of the substrate. The groove has an outside surface of the electrode as one side surface, and the groove is opened on the surface side of the insulation layer. The first end surface of the electrode buried in the insulation layer protrudes from the surface of the insulation layer.
Public/Granted literature
- US20160013099A1 SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD Public/Granted day:2016-01-14
Information query
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