Invention Grant
- Patent Title: Image sensors including semiconductor channel patterns
-
Application No.: US14732129Application Date: 2015-06-05
-
Publication No.: US09761636B2Publication Date: 2017-09-12
- Inventor: Tae-Yon Lee , Masaru Ishii
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR
- Agency: Ward and Smith, P.A.
- Priority: KR10-2014-0098249 20140731
- Main IPC: H01L29/04
- IPC: H01L29/04 ; H01L29/10 ; H01L31/00 ; H01L27/30

Abstract:
The inventive concepts relate to image sensors. The image sensor includes a substrate including a floating diffusion region and a pixel circuit, an interlayer insulating layer on the substrate, a contact node and a first electrode on the interlayer insulating layer, a dielectric layer on a top surface of the first electrode, a channel semiconductor pattern on the dielectric layer and connected to the contact node, and a photoelectric conversion layer on the channel semiconductor pattern. The channel semiconductor pattern includes a semiconductor material having an electron mobility that is higher than an electron mobility of the photoelectric conversion layer.
Public/Granted literature
- US20160037098A1 Image Sensors Including Semiconductor Channel Patterns Public/Granted day:2016-02-04
Information query
IPC分类: