- 专利标题: Semiconductor wafer, method of producing semiconductor wafer, and heterojunction bipolar transistor
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申请号: US15187016申请日: 2016-06-20
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公开(公告)号: US09761686B2公开(公告)日: 2017-09-12
- 发明人: Sadanori Yamanaka , Naohiro Nishikawa , Tsuyoshi Nakano
- 申请人: SUMITOMO CHEMICAL COMPANY, LIMITED
- 申请人地址: JP Chuo-ku, Tokyo
- 专利权人: SUMITOMO CHEMICAL COMPANY, LIMITED
- 当前专利权人: SUMITOMO CHEMICAL COMPANY, LIMITED
- 当前专利权人地址: JP Chuo-ku, Tokyo
- 代理机构: Sughrue Mion, PLLC
- 优先权: JP2015-125191 20150622
- 主分类号: H01L21/00
- IPC分类号: H01L21/00 ; H01L29/00 ; H01L29/66 ; H01L29/737 ; H01L21/02 ; H01L29/207
摘要:
Techniques are provided that can impart sufficient electrical conductivity to a semiconductor crystal exhibiting low doping efficiency for silicon atoms, such as InGaAs, by implanting only a small amount of silicon atoms. Such a semiconductor wafer may include a first semiconductor crystal layer, a second semiconductor crystal layer exhibiting a conductivity type that is different from the first layer, a third semiconductor crystal layer exhibiting the conductivity type of the first layer and having a larger band gap than the second semiconductor crystal layer, and a fourth semiconductor crystal layer exhibiting the conductivity type of the first layer and having a smaller band gap than the third semiconductor crystal layer. The fourth semiconductor crystal layer contains a first element that generates a first carrier of a corresponding conductivity type and a second element that generates a second carrier of a corresponding conductivity type.
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