- Patent Title: Apparatus and method for measuring pretilt angle of liquid crystal
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Application No.: US14704136Application Date: 2015-05-05
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Publication No.: US09766061B2Publication Date: 2017-09-19
- Inventor: Sejoon Oh
- Applicant: Samsung Display Co., Ltd.
- Applicant Address: KR Yongin-si
- Assignee: Samsung Display Co., Ltd.
- Current Assignee: Samsung Display Co., Ltd.
- Current Assignee Address: KR Yongin-si
- Agency: H.C. Park & Associates, PLC
- Priority: KR10-2014-0165503 20141125
- Main IPC: G01B11/26
- IPC: G01B11/26 ; G01N21/21 ; G02F1/13 ; G02F1/1337 ; G02F1/139

Abstract:
An apparatus and method for measuring a pretilt angle of a liquid crystal (LC) are disclosed. The method includes irradiating polarized light on an LC cell including a first substrate, a second substrate facing the first substrate, and an LC layer between the first substrate and the second substrate. At least one of the first substrate and the second substrate includes a minute branch electrode. Irradiated light is scanned within a predetermined angle range in a direction not parallel to the minute branch electrode, an intensity of light that is transmitted through the LC cell is detected, and a pretilt angle of the LC is obtained by using a light intensity detection signal corresponding to the transmitted light.
Public/Granted literature
- US20160146596A1 APPARATUS AND METHOD FOR MEASURING PRETILT ANGLE OF LIQUID CRYSTAL Public/Granted day:2016-05-26
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