Invention Grant
- Patent Title: Image measurement device and image measurement method
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Application No.: US14728603Application Date: 2015-06-02
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Publication No.: US09767578B2Publication Date: 2017-09-19
- Inventor: Hideto Motomura , Yoshikuni Sato , Yasuhiko Adachi
- Applicant: Panasonic Intellectual Property Management Co., Ltd.
- Applicant Address: JP Osaka
- Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Current Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Current Assignee Address: JP Osaka
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: JP2013-145889 20130711
- Main IPC: H04N9/47
- IPC: H04N9/47 ; H04N7/18 ; G06T7/40 ; G06T7/00 ; G06K9/00 ; G06T7/90 ; G06K9/20

Abstract:
An image measurement device including: light sources that irradiate light beams having different peak wavelengths; a staining method obtaining unit which obtains information indicating a staining method of an inspection specimen; an image obtaining unit which: selects a combination of light sources according to the staining method, based on illumination information; and capture inspection images of the inspection specimen with light beams from the selected light sources, and capture reference images of a reference specimen with light beams from the respective light sources; a calculating unit which calculates a positivity based on the inspection images; and an evaluation unit which associates the staining method of the reference specimen with the combination of light sources to generate the illumination information based on a total value of coefficients in a linear sum of the ortho-normalization base vectors of a spectral distribution of light sources calculated based on the reference images.
Public/Granted literature
- US20150262384A1 IMAGE MEASUREMENT DEVICE AND IMAGE MEASUREMENT METHOD Public/Granted day:2015-09-17
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