Invention Grant
- Patent Title: System for determining sensor condition
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Application No.: US14533434Application Date: 2014-11-05
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Publication No.: US09767671B2Publication Date: 2017-09-19
- Inventor: Rita Chattopadhyay
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: INTEL CORPORATION
- Current Assignee: INTEL CORPORATION
- Current Assignee Address: US CA Santa Clara
- Agency: Grossman, Tucker, Perreault & Pfleger, PLLC.
- Main IPC: G08B23/00
- IPC: G08B23/00 ; G08B21/18 ; G08B25/08 ; G08B13/14 ; H04Q5/22 ; G01C25/00

Abstract:
The present disclosure is directed to a system for determining sensor condition. A sensor signal generated by a sensor to communicate the current condition of an aspect being monitored by the sensor may also be employed to determine the condition of the sensor itself. For example, a device capable of determining if the sensor condition is normal or malfunctioning (e.g., erratic, stuck, etc.) may comprise a monitoring module (MM) to receive the sensor signal. The MM may comprise a sensor condition determination module (SCDM) to determine sensor condition. The SCDM may include a feature extraction engine to determine various characteristics of (e.g., to “extract features” from) the sensor signal and a model to determine sensor condition based on the extracted features. The model may include a support vector machine (SVM) taught to determine sensor condition utilizing sampled sensor signals correlated with annotations of sensor condition.
Public/Granted literature
- US20160125720A1 SYSTEM FOR DETERMINING SENSOR CONDITION Public/Granted day:2016-05-05
Information query