Invention Grant
- Patent Title: System for performing distortion correction and calibration using pattern projection, and method using the same
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Application No.: US14688982Application Date: 2015-04-16
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Publication No.: US09774837B2Publication Date: 2017-09-26
- Inventor: Ji Ho Chang , Dae Hwan Hwang , Kwang Ho Yang , Eul Gyoon Lim , Jae Il Cho
- Applicant: Electronics and Telecommunications Research Institute
- Applicant Address: KR Daejeon
- Assignee: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Current Assignee: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Current Assignee Address: KR Daejeon
- Priority: KR10-2014-0045744 20140417
- Main IPC: H04N9/31
- IPC: H04N9/31 ; G06T7/80 ; H04N17/00 ; H04N13/02

Abstract:
Disclosed are a system and method for performing distortion correction and calibration using a pattern projected by a projector. The system for performing distortion correction and calibration includes a projector that projects a pattern, at least one camera that generates a photographed pattern image by photographing an image onto which the pattern is projected, and an image processing device that calculates a calibration parameter by comparing an original pattern image projected by the projector and the photographed pattern image. Thus, it is possible to obtain an accurate depth image by easily utilizing an image for the pattern projected by the projector. In addition, when obtaining the depth image, the calibration parameter for correcting image distortion according to camera lens and a calibration state of cameras may be efficiently obtained using the pattern projected by the projector.
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