Invention Grant
- Patent Title: Thin film forming method
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Application No.: US14730530Application Date: 2015-06-04
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Publication No.: US09777366B2Publication Date: 2017-10-03
- Inventor: Akinobu Kakimoto , Atsushi Endo , Takahiro Miyahara , Shigeru Nakajima , Satoshi Takagi , Kazumasa Igarashi
- Applicant: TOKYO ELECTRON LIMITED
- Applicant Address: JP Tokyo
- Assignee: TOKYO ELECTRON LIMITED
- Current Assignee: TOKYO ELECTRON LIMITED
- Current Assignee Address: JP Tokyo
- Agency: Cantor Colburn LLP
- Priority: JP2011-217390 20110930; JP2011-240840 20111102
- Main IPC: H01L21/479
- IPC: H01L21/479 ; C23C16/24 ; C30B25/02 ; C30B29/06 ; C23C16/02 ; C23C16/04 ; C23C16/455 ; H01L21/02 ; H01L21/67

Abstract:
A thin film forming method which forms a seed film and an impurity-containing silicon film on a surface of an object to be processed in a processing container configured to be vacuum exhaustible, the thin film forming method includes: performing a first step which forms the seed film formed of a compound of silicon, carbon and nitrogen on the surface of the object by supplying a seed film raw material gas comprising an aminosilane-based gas into the processing container; and performing a second step which forms the impurity-containing silicon film in an amorphous state on the seed film by supplying a silane-based gas and an impurity-containing gas into the processing container.
Public/Granted literature
- US20150270126A1 THIN FILM FORMING METHOD Public/Granted day:2015-09-24
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