Invention Grant
- Patent Title: Inspection apparatus, inspection method, and program
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Application No.: US15586303Application Date: 2017-05-04
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Publication No.: US09778203B2Publication Date: 2017-10-03
- Inventor: Hajime Matsuda
- Applicant: Keyence Corporation
- Applicant Address: JP Osaka
- Assignee: Keyence Corporation
- Current Assignee: Keyence Corporation
- Current Assignee Address: JP Osaka
- Agency: Kilyk & Bowersox, P.L.L.C.
- Priority: JP2014-119102 20140609
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01N21/88 ; G06T7/00 ; G06T7/586 ; G06K9/20 ; G06K9/32 ; G01N21/84

Abstract:
To facilitate adjusting of a distance from an inspection target to an illumination section by providing a movable illumination section that is movable independently of the imaging section. An illumination apparatus has a plurality of LEDs arranged in a substantially annular form, a light diffusion member for diffusing light emitted from the plurality of LEDs, and a lighting control part for lighting the plurality of light sources in accordance with a predetermined lighting pattern when designated to start lighting. In particular, the illumination apparatus moves independently of a camera to adjust a distance to a workpiece.
Public/Granted literature
- US20170254758A1 Inspection Apparatus, Inspection Method, And Program Public/Granted day:2017-09-07
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