Invention Grant
- Patent Title: Non-contact AC voltage measurement device
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Application No.: US15501716Application Date: 2014-08-08
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Publication No.: US09778294B2Publication Date: 2017-10-03
- Inventor: Fujitsugu Iida , Tomomi Iida , Shin-ichi Kaito
- Applicant: IIDA ELECTRONICS CO., LTD. , NATIONAL INSTITUTE OF TECHNOLOGY
- Applicant Address: JP Ibaraki JP Hachioji-shi
- Assignee: IIDA ELECTRONICS CO., LTD.,NATIONAL INSTITUTE OF TECHNOLOGY
- Current Assignee: IIDA ELECTRONICS CO., LTD.,NATIONAL INSTITUTE OF TECHNOLOGY
- Current Assignee Address: JP Ibaraki JP Hachioji-shi
- Agency: Studebaker & Brackett PC
- International Application: PCT/JP2014/071024 WO 20140808
- International Announcement: WO2016/021045 WO 20160211
- Main IPC: G01R31/02
- IPC: G01R31/02 ; G01R19/175

Abstract:
A non-contact AC voltage measurement device 100 applied to a conductor 12 of an electric wire 16, the device 100 being characterized in that a first electrode 32 is provided outside the electric wire 16, whereby a coupling capacitance 34 is formed between the conductor 12 and the first electrode 32, a parallel circuit 38 having a capacitor 40 and an opening/closing means 50 connected in parallel to the capacitor 40 is provided, the parallel circuit is connected in series to the coupling capacitance, and a first current I1 which flows through the parallel circuit 38 when the opening/closing means 50 of the parallel circuit 38 is closed and a second current I2 which flows through the parallel circuit 38 when the opening/closing means 50 is open are measured for the purpose of measuring the AC voltage 8 applied to the conductor 12.
Public/Granted literature
- US20170227582A1 NON-CONTACT AC VOLTAGE MEASUREMENT DEVICE Public/Granted day:2017-08-10
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