Invention Grant
- Patent Title: Target holding jig and measurement apparatus
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Application No.: US14442551Application Date: 2014-01-10
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Publication No.: US09778347B2Publication Date: 2017-10-03
- Inventor: Kosuke Kotani
- Applicant: MITSUBISHI HITACHI POWER SYSTEMS, LTD.
- Applicant Address: JP Kanagawa
- Assignee: MITSUBISHI HITACHI POWER SYSTEMS, LTD.
- Current Assignee: MITSUBISHI HITACHI POWER SYSTEMS, LTD.
- Current Assignee Address: JP Kanagawa
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: JP2013-005667 20130116
- International Application: PCT/JP2014/050361 WO 20140110
- International Announcement: WO2014/112443 WO 20140724
- Main IPC: G01C3/08
- IPC: G01C3/08 ; G01S7/481 ; G01B21/04 ; G01B5/00 ; G01C15/06 ; G01B11/24

Abstract:
The target holding jig which holds a spherical target including a reflection mechanism for reflecting measurement light emitted from a light source, and brings the target and an end surface of an object to be measured into contact with each other, includes a supporting portion configured to support the target being in contact with the object to be measured, a guide portion disposed on a side of the supporting portion facing the object to be measured, regulating a contact position of the target with the object to be measured in a short side direction of the end surface of the object to be measured, and restricting the movement of the target in the short side direction of the end surface of the object to be measured, and a coupling portion fixed to the supporting portion, and removably coupled to the object to be measured.
Public/Granted literature
- US20160291133A1 TARGET HOLDING JIG AND MEASUREMENT APPARATUS Public/Granted day:2016-10-06
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