Invention Grant
- Patent Title: Array substrate and method for detecting the same
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Application No.: US14416302Application Date: 2014-12-03
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Publication No.: US09778527B2Publication Date: 2017-10-03
- Inventor: Zui Wang , Shih Hsun Lo
- Applicant: SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Applicant Address: CN Shenzhen
- Assignee: SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Current Assignee: SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Current Assignee Address: CN Shenzhen
- Agency: Buchanan Ingersoll & Rooney PC
- Priority: CN201410650209 20141114
- International Application: PCT/CN2014/092888 WO 20141203
- International Announcement: WO2016/074292 WO 20160519
- Main IPC: G02F1/1362
- IPC: G02F1/1362 ; G02F1/13 ; G01R31/02 ; G09G3/00

Abstract:
An array substrate and a method for detecting the array substrate are disclosed. The array substrate comprises a display area and a detecting area. In a first detecting mode, a first to a sixth detecting circuits are divided into three groups, and a first detecting signal is successively provided to these three groups of detecting circuits, so that a circuit defect possibly existing in a charge line and a share line that are located in each row of subarea can be detected. In a second detecting mode, the first to the sixth detecting circuits are divided into two groups, and a second detecting signal is provided to the two groups of detecting circuits successively, so that a circuit defect possible existing in the charge line and the share line that are located in adjacent rows of subareas can be detected.
Public/Granted literature
- US20160342050A1 ARRAY SUBSTRATE AND METHOD FOR DETECTING THE SAME Public/Granted day:2016-11-24
Information query
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